YONSEI UNIVERSITY WONJU INDUSTRY-ACADEMIC COOPERATION FOUNDATION
发明人:
KIM, HEE JOUNG,김희중,CHOI, YU NA,최유나,CHO, HYO MIN,조효민
申请号：
KR1020120100174
公开号：
KR1013472540000B1
申请日:
2012.09.10
申请国别(地区):
KR
年份:
2014
代理人:
摘要：
Disclosed is a method for correcting images obtained with a photon counting-based X-ray detector. The method includes a step of measuring the number of detection photons detected in each pixel of the photon counting-based X-ray detector after passing through a medium while the thickness of the medium is changed； a step of analyzing a relation between each thickness of the medium and the number of incident photons in each pixel based on the measurement； a step of estimating response properties of each pixel according to the analyzed relation； and a step of correcting the number of detection photons detected from each pixel by applying the estimated response properties of each pixel to images on which a subject is photographed. [Reference numerals] (AA) Start； (BB) End； (S310) Measurement of the number of detection photons detected at each pixel of a detector after passing through a medium while the thickness of the medium is changed； (S320) Analysis of a relation between the thickness of the medium and the number of incident photons on each pixel； (S330) Estimation of the response properties of each pixel； (S340) Determination of the equivalent medium thickness corresponding to an object by each pixel based on the response properties of each pixel； (S350) Determination of the number of the detection photons of each pixel based on the ideal number of the detection photons of each pixel corresponding to the thickness of the equivalent medium광자계수 기반의 엑스선 검출기로 획득한 영상을 보정하는 방법이 개시된다. 상기 방법은, 매질의 두께를 변화시켜가며 상기 매질을 통과한 후 상기 광자계수 기반의 엑스선 검출기의 각 픽셀에서 검출된 검출 광자 수를 측정하는 단계와； 상기 측정에 근거하여 상기 매질의 각 두께와 상기 각 픽셀에 입사된 광자의 수와의 관계를 분석하는 단계와； 상기 분석된 관계에 따라 상기 각 픽셀의 응답특성을 추정하는 단계와； 임의의 피사체가 촬영된 영상에 상기 추정된 각 픽셀의 응답특성을 적용하여 상기 각 픽셀에서 검출된 검출 광자 수를 보정하는 단계를 포함할 수 있다.
