There is provided a system for measuring a property of a sample that comprises a test strip for collecting the sample； a diagnostic measuring device configured to receive the test strip and measure a concentration of an analyte in the sample received on the test strip； and the diagnostic measuring device further comprising a processor programmed to execute an analyte correction for correcting a measurement of the sample due to one or more interferents, comprising: calculating an interferent impedance measurement including a magnitude measurement and a phase measurement using a switched capacitor accumulator to measure a phase angle； and adjusting the measurement of the analyte in the sample using that the calculated interferent impedance measurement.
