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System and method for simulated linearization of curved surface
专利权人:
Swanwa Liao
发明人:
Swanwa Liao
申请号:
US13081895
公开号:
US08417004B2
申请日:
2011.04.07
申请国别(地区):
US
年份:
2013
代理人:
摘要:
In accordance with embodiments of the present disclosure, a method may include mapping an ellipse with its center at the origin of an xy-coordinate plane to a circle with its center at the origin of the xy-coordinate plane. The method may also include transforming a three-dimensional subject image including a curved profile in the xy-coordinate plane to an intermediate image based at least on the mapping of the ellipse to a base circle. The method may further include transforming the intermediate image to a transformed image having a linear profile by distorting each of one or more points of interest of the intermediate image based at least on a dimension of the circle and a coordinate of such point.
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中国工程科技知识中心
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