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Patterned implant and method
专利权人:
AMS RESEARCH CORPORATION
发明人:
JAGGER, KARL A.,HACKER, DEAN,FELTON, JESSICA,FRIGSTAD, JOHN R.,PETERSON, ALEX
申请号:
AU2013206296
公开号:
AU2013206296B2
申请日:
2013.06.13
申请国别(地区):
AU
年份:
2015
代理人:
摘要:
PATTERNED IMPLANT AND METHOD A unitary or homogeneous patterned implant (10) is provided. The implant (10) is constructed of patterned cells formed by way of a moulding, die casting, laser etching, laser cutting, extruding, and the like. Portions of the implants (10) can be formed into sinusoid or other waveform strut members (14) to control and promote elongation, expansion or contraction along single or multiple axes. As such, controlled and designated stress, tension and compression distribution is promoted across specific or localized areas of the implant (10).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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