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DROP TESTING APPARATUS
专利权人:
KOREA AEROSPACE RESEARCH INSTITUTE
发明人:
LEE Jung Jin,KIM Joong Wook
申请号:
US201715801870
公开号:
US2018120208(A1)
申请日:
2017.11.02
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
A drop testing apparatus is provided. The drop testing apparatus includes a plate connected to an external crane, a magnet holder provided at one end of the plate and fixed to the plate by an electromagnetic force, a counterweight provided at another end of the plate and facing the magnet holder, a dummy structure connected to the magnet holder through a connecting member and having a test specimen installed at one side thereof, a load cell unit provided between the dummy structure and the test specimen to measure impulse of the test specimen, and a controller configured to control the electromagnetic force to be created in the magnet holder and to receive the impulse measured by the load cell unit. When the electromagnetic force is cancelled, the connecting member disengages from the magnet holder, and the dummy structure and the test specimen fall onto the ground.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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