VERFAHREN FÜR DIE DIAGNOSTIK IN DER KIEFERORTHOPÄDIE

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专利权人:

Sirona Dental Systems GmbH

发明人:

ABKAI, Ciamak,LINDENBERG, Kai,LUDWIG, Björn

申请号：

EP15808364.2

公开号：

EP3223708A1

申请日:

2015.11.25

申请国别(地区):

EP

年份:

2017

代理人:

摘要：

The invention relates to an orthodontic diagnostic method wherein at least one initial two-dimensional X-ray image (1) of a first zone (2) of a head (3) is taken. Then at least one three-dimensional X-ray image (4) of a second zone (5) of a dental situation is taken, and the three-dimensional X-ray image (4) is combined with the initial two-dimensional X-ray image (1) using a registration process in order to obtain a full image (8).

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/