SYSTÈMES ET PROCÉDÉS POUR MESURER ET CARACTÉRISER DES SURFACES INTÉRIEURES DE STRUCTURES LUMINALES

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专利权人:

VS MEDTECH; INC.

发明人:

STERN, ROGER, A.

申请号：

EP14791528

公开号：

EP2991549A4

申请日:

2014.05.02

申请国别(地区):

EP

年份:

2016

代理人:

摘要：

A digital topographic model of the luminal surface is generated by projecting an optical pattern on the luminal surface from the first location within the lumen. At least a portion of the projected pattern is detected from a second location within the lumen which is based apart from the first location. The dimensions of the luminal wall can be measured by triangulation in order to produce the digital topographic model of the body lumen.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/