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IMAGING SYSTEM AND METHOD WITH SCATTER CORRECTION
专利权人:
GE Sensing & Inspection Technolgies GmbH
发明人:
Alexander SUPPES,Nils ROTHE
申请号:
US15556086
公开号:
US20180266970A1
申请日:
2015.03.06
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A method for imaging an object is presented. The method includes acquiring a first projection image of the object using a source and a detector, positioning a scatter rejecting aperture plate between the object and the detector, and acquiring a second projection image of the object with the scatter rejecting aperture plate disposed between the object and the detector. A scatter image of the object is generated based on the first projection image and the second projection image, and stored for subsequent imaging. A volumetric CT system for imaging an object is also presented. The system is configured to acquire a plurality of projection images of the object from a plurality of plurality of projection angles.
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中国工程科技知识中心
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