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PARTICLE IRRADIATION TREATMENT DEVICE AND TREATMENT PLANNING CORRECTIVE METHOD
专利权人:
发明人:
SAKAMOTO, YUSUKE,坂本裕介,坂本裕介,NISHIZAWA, HIROSHI,西沢志,西沢志,HAYASHI, MASATERU,林真照,林真照,AZUMA, TETSUSHI,东哲史,東哲史,YAMAMOTO, KAZUO,山本和男,山本和男,HIRANO, YUKIKO,平野有希子,平野有希子,MAEDA, NATSUKO,前田奈津子,前田奈津子,KISHII, YASUTO
申请号:
TW105117949
公开号:
TWI600451B
申请日:
2016.06.07
申请国别(地区):
TW
年份:
2017
代理人:
摘要:
A particle irradiation treatment device (50) of the present invention includes an irradiation dose distribution calculating device (10) including: a beam information memorizing portion (a test energy memorizing portion (14), a test charge memorizing portion (12), and a test beam central axle memorizing portion (13)) for memorizing test particle beam information of particle beam information of a particle beam (20) tested by testing devices (6, 7, 8) a summarized dose calculating portion (15) for calculating a irradiation dose distribution (summarized irradiation dose distribution (Di)) according to the test particle beam information (energy (E), test beam dose (test charge amount (Q), test beam central axle position (Px, Py)) and a planning irradiation dose comparing portion (16) for calculating differences belonging to the irradiation dose distribution (summarized dose distribution (Di)) and a target dose distribution (Dobji) as a dose distribution difference (△ Di). The summarized dose calculating portion (15) summarizes time period dose that irradiation particle amount (particle amount (wk)) multiplied with one unit particle dose (dose (di,k)) in all time periods, and calculates a dose of a calculating object point of a calculating object, wherein the irradiation particle amount is calculated according to the test energy and the test beam dose in a same period of the time periods while testing the particle beam information. The unit particle dose is calculated by the dose given from a particle of the particle beam according to the test energy and the test beam central axle position. After second time of treatment irradiation, the particle irradiation treatment device (50) performs a control according to control date of corrected beam dose (corrected total charge amount (QCj)) corrected by the dose distribution difference (△ Di).本發明之粒子射線治療裝置(50)係包括線量分布演算裝置(10),該線量分布演算裝置(10)係包括:射束資訊記憶部(測量能量記憶部(14)、測量電荷記憶部(12)、測量射束中心軸記憶部(13)),係記憶由測量裝置(6、7、8)所測量之粒子射束20的粒子射束資訊之測量粒子射束資訊
来源网站:
中国工程科技知识中心
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