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MÉTHODE ET DISPOSITIF DIMAGERIE RÉTINIENNE A HAUTE RÉSOLUTION
专利权人:
IMAGINE EYES
发明人:
LEVECQ, XAVIER,LAMORY, BARBARA
申请号:
EP12703735.6
公开号:
EP2670294B1
申请日:
2012.01.27
申请国别(地区):
EP
年份:
2015
代理人:
摘要:
The invention relates to a method and a device for high-resolution retinal imaging, said device including a source (LSr) for emitting a light beam for illuminating the retina of an eye (10) of a subject, a detection device (12) capable of detecting spatial-frequency structures of 250 cycles/mm measured in the plane of the retina, an optical imaging system (16) for forming an image of at least a portion of the retina on said detection device (12), a device (15) for measuring optical defects with a plane for analyzing optical defects, a correction device (14) including a correction plane and being suitable for correcting, in said correction plane, the light rays emitted from said emission source (LSr) and back-scattered by the retina in accordance with the optical defects measured by the measuring device (15). The correction and analysis planes are optically contiguous with a predetermined plane (17) of the eye, and the input pupil of said optical imaging system has a diameter between a first value Φmin and a second value Φmax, the first value being defined so as to enable the detection, by said detection device (12) and at an imaging wavelength, of structures of the retina having a spatial frequency of 250 cycles per millimeter, while the second value is lower than 5.75 mm.Linvention concerne une méthode et un dispositif dimagerie rétinienne à haute résolution comprenant notamment une source démission (LSr) dun faisceau lumineux pour lillumination de la rétine dun oeil (10) dun sujet, un dispositif (12) de détection apte à détecter des structures de fréquence spatiale de 250 cycles/mm mesurées dans le plan de la rétine, un système optique (16) dimagerie permettant la formation dune image dau moins une partie de la rétine sur le dispositif de détection (12), un dispositif (15) de mesure de défauts optiques avec un plan danalyse des défauts optiques, un dispositif (14) de correction comprenant un plan de correction et destiné à corriger dans ledit plan de correction le
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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