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角膜経上皮電気抵抗値の測定方法及び装置
专利权人:
国立大学法人;長崎大学
发明人:
上松 聖典,北岡 隆,西田 幸二,田中 佑治,西澤 松彦,梶 弘和,関根 宗一郎
申请号:
JP2010501917
公开号:
JP5470508B2
申请日:
2009.03.03
申请国别(地区):
JP
年份:
2014
代理人:
摘要:
The present invention provides an evaluation method of a corneal disorder that can measure a disorder of a cornea quantitatively and is applicable to living eyes. A method for measuring a corneal transepithelial electric resistance comprises placing electrodes on the cornea and a conjunctiva. The method for measuring a corneal transepithelial electric resistance comprises: (1) a step of placing a first electrode on the cornea and a second electrode on the conjunctiva and (2) a step of flowing an electric current between the first electrode and the second electrode to measure the electric resistance. And a device for measuring a corneal transepithelial electric resistance value.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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