角膜経上皮電気抵抗値の測定方法及び装置

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专利权人:

国立大学法人;長崎大学

发明人:

上松 聖典,北岡 隆,西田 幸二,田中 佑治,西澤 松彦,梶 弘和,関根 宗一郎

申请号：

JP2010501917

公开号：

JP5470508B2

申请日:

2009.03.03

申请国别(地区):

JP

年份:

2014

代理人:

摘要：

The present invention provides an evaluation method of a corneal disorder that can measure a disorder of a cornea quantitatively and is applicable to living eyes. A method for measuring a corneal transepithelial electric resistance comprises placing electrodes on the cornea and a conjunctiva. The method for measuring a corneal transepithelial electric resistance comprises: (1) a step of placing a first electrode on the cornea and a second electrode on the conjunctiva and (2) a step of flowing an electric current between the first electrode and the second electrode to measure the electric resistance. And a device for measuring a corneal transepithelial electric resistance value.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/