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測定多胞胎妊娠之胎兒基因組
专利权人:
THE CHINESE UNIVERSITY OF HONG KONG
发明人:
LO, YUK MING DENNIS,CHIU, ROSSA WAI KWUN,CHAN, KWAN CHEE
申请号:
TW103109991
公开号:
TW201441373A
申请日:
2014.03.17
申请国别(地区):
TW
年份:
2014
代理人:
摘要:
Techniques are provided for determining inheritance of maternal and paternal haplotypes in pregnancies with multiple fetuses. Maternal inheritance can be determined at loci where the mother is heterozygous and the paternally inherited alleles are known (e.g., the father is homozygous). Two types of loci may be used, where one type has the paternal allele appear on a first maternal haplotype, and another type has the paternal allele appear on a second maternal haplotype. Paternal inheritance can be determined from loci where the father is heterozygous and the mother is homozygous. Amounts of different alleles at each locus can be measured. A comparison of the amounts (e.g., using a fractional concentration of each allele and cutoffs) can be used to determine the haplotype inheritance. A haplotype can be linked to a condition of interest.本發明提供用於在多胞胎妊娠中測定母本及父本單倍型之遺傳的技術。母本遺傳可在其中母體為異型接合且父本遺傳之對偶基因已知(例如父體為同型接合)的基因座處測定。可使用兩種類型之基因座,其中一種類型在第一母本單倍型上出現父本對偶基因,而另一種類型在第二母本單倍型上出現父本對偶基因。父本遺傳可自其中父體為異型接合而母體為同型接合之基因座測定。可量測不同對偶基因在各基因座處之量。該等量之比較(例如使用各對偶基因之分數濃度及截止值)可用於測定單倍型遺傳。單倍型可能與所關注之病狀有關。
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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