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高度測定装置及び高度測定方法
专利权人:
日本電気株式会社
发明人:
樋口 利光
申请号:
JP20120268122
公开号:
JP6142516(B2)
申请日:
2012.12.07
申请国别(地区):
日本
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To perform altitude measurement of an object to be measured by simple structure without using many antenna elements.SOLUTION: An altitude measuring apparatus comprises: an envelope detection part which detects an envelope signal of a signal generated by interference between a first signal and a second signal and outputs the envelope signal as an amplitude fluctuation signal when a signal radiated from an object to be measured with unknown altitude comes to a measurement subject as the first signal and the second signal via different routes; a fundamental frequency detection unit which calculates a fundamental frequency from the amplitude fluctuation signal; a parameter acquisition unit which acquires a horizontal position, the altitude, speed of the measurement subject, and a horizontal position of the object to be measured; and an altitude operation part which calculates the altitude of the object to be measured according to a predetermined operational expression by using a parameter ac
来源网站:
中国工程科技知识中心
来源网址:
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