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光構造計測装置及びその光プローブ
专利权人:
富士フイルム株式会社
发明人:
井上 敏之
申请号:
JP2009117655
公开号:
JP5236573B2
申请日:
2009.05.14
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
In an embodiment of the present invention, an OCT probe is configured by including: a thin and long substantially cylindrical sheath whose distal end is closed an n-reflecting surface body, as an irradiating device, which has n reflecting surfaces (with n being an integer of three or more) and which is provided in a distal end portion of the sheath a torque transmitting coil, as a rotating device, which is provided along the longitudinal axis of the sheath and which transmits rotational torque for rotating each of the reflection surfaces of the n-reflecting surface body about the longitudinal axis of the sheath and n fibers (1) to (n), as an n-channel waveguide device, which are provided and fixed in the sheath in a side by side relationship with the torque transmitting coil.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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