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Measuring apparatus, measuring method, and parameter setting method
专利权人:
Yoichi Toriumi
发明人:
Yoichi Toriumi,Hideo Kawabe,Kenichi Kabasawa,Tatsuya Suzuki,Hirokazu Imai,Masatoshi Ueno
申请号:
US14356020
公开号:
US09566005B2
申请日:
2012.09.10
申请国别(地区):
US
年份:
2017
代理人:
摘要:
There is provided a measuring apparatus, including a light receiving element, provided at a position facing a measurement object region on which is placed a measurement object, which forms an image with light from the measurement object region, light emitting elements, arranged surrounding the light receiving element, which emit light for measuring the measurement object, and reflective optical elements, provided above the light emitting elements, which guide, to the measurement object region, emission light radiated from the light emitting elements. A light receiving surface of the light receiving element and light emission surfaces of the light emitting elements are positioned mutually on a same plane. The emission light radiated from the light emitting elements is reflected by the reflective optical elements, and center lines of the emission light radiated from each of the light emitting elements pass through an approximate center of the measurement object region.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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