METHOD AND APPARATUS FOR MEASURING BIOMETRICS OF OBJECT

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专利权人:

SAMSUNG ELECTRONICS CO.; LTD.

发明人:

JUNG, HAE-KYUNG,YOON, HEE-CHUL,LEE, HYUN-TAEK,KIM, YONG-JE,KIM, JAE-HYUN,EOM, MYUNG-JIN

申请号：

CA2800419

公开号：

CA2800419A1

申请日:

2013.01.02

申请国别(地区):

CA

年份:

2013

代理人:

摘要：

A method and apparatus for automatically measuring biometrics of an object.The method includes receiving an image of an object, modeling the object suchthatat least one part thereof may be identified, and measuring biometrics of theobjectbased on a result of modeling the object.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/