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Method and apparatus for obtaining x-ray image of region of interest of object
专利权人:
SAMSUNG ELECTRONICS CO.; LTD.
发明人:
Tae-kyun Kim,Sung-nam Kim,Jae-chool Lee
申请号:
US14301820
公开号:
US09554762B2
申请日:
2014.06.11
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A method of obtaining an X-ray image, the method including: obtaining a first image of an object; receiving a determination whether the first image includes an entirety of a region of interest (ROI); and obtaining a second image of the object, the second image including a portion of the ROI which is absent in the first image.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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