A method for measuring a spinal implant comprises the steps of: providing a device including a gauge configured to measure an angle in a measuring plane and extending to an engagement surface disposing the engagement surface with a first selected position of an implant or an anatomy, the first selected position being disposed at a first orientation calibrating the gauge to a zero angle measurement at the first orientation disposing the engagement surface with a second selected position of the implant or the anatomy, the second selected position being disposed at a second orientation and measuring an angle of the second orientation relative to the first orientation such that the gauge determines the angle relative to the zero angle measurement. Various devices are disclosed.
