BOE TECHNOLOGY GROUP CO., LTD.;HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
发明人:
Wang Qingpu,Hu Ming,Xie Taofeng
申请号：
US201514742853
公开号：
US9952130(B2)
申请日:
2015.06.18
申请国别(地区):
美国
年份:
2018
代理人:
Westman, Champlin & Koehler, P.A.
摘要：
The present invention relates to a field of display technology, in particular, to a jig for dropping ball test. The jig for dropping ball test comprises a fixing device and a dropping ball device. The fixing device comprises a plurality of adjusting rods for fixing a sample to be tested, a test region corresponding to the shape of the sample to be tested is enclosed by the plurality of adjusting rods. The dropping ball device is used to drop a ball towards the sample to be tested. The fixing device of the jig can be adjusted in its size according to the size of a sample to be tested, so that the dropping ball test can be carried out for different samples, which is easy to operate and reduces manufacturing cost.
