您的位置: 首页 > 农业专利 > 详情页

複數波長之斷層成像系統
专利权人:
MINGHSIN UNIVERSITY OF SCIENCE AND TECHNOLOGY
发明人:
YANG, BOR WEN,杨伯温,楊伯溫
申请号:
TW102204622
公开号:
TWM455474U
申请日:
2013.03.13
申请国别(地区):
TW
年份:
2013
代理人:
摘要:
The invention discloses a multi wavelength fault imaging system, which comprises a light source generator, a light dividing module, an objective lens, a scanning module, a sensing module, a database and a processing module.A light source generator generates a plurality of light beams of different wavelengths.The beam splitting module receives each beam, and divides each beam into reference beam and detection beam.The objective lens receives the reference beam and reflects it to the beam splitter module.The scanning module receives the detecting beam and projects the detecting beam to the object to be tested, and the object to be tested reflects a plurality of measuring beams to the spectroscopic module through the scanning module.The sensing module receives a reference beam and a plurality of measuring beams from the beam splitter module, and generates a plurality of measuring signals accordingly.The database stores a number of spectral data.According to the measured signal and spectral data, the processing module can build the full-color tomographic image.本創作係揭露一種複數波長之斷層成像系統,其包含光源產生器、分光模組、物鏡、掃描模組、感測模組、資料庫及處理模組。光源產生器產生不同波長之複數個光束。分光模組接收各光束,並將各光束區分為參考光束及檢測光束。物鏡接收參考光束並反射至分光模組。掃描模組接收檢測光束,並將檢測光束投射至待檢物,且待檢物反射複數個量測光束經由掃描模組至分光模組。感測模組接收來自於分光模組之參考光束及複數個量測光束,並據以產生複數個量測訊號。資料庫儲存複數筆光譜資料。處理模組根據量測訊號及光譜資料,以建立全彩斷層影像。
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充