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IRRADIATION SYSTEM INCLUDING AN ELECTRON-BEAM SCANNER
专利权人:
Boris Oreper
发明人:
Boris Oreper,Douglas P. Boyd,Nikolay Rolshud
申请号:
US13236011
公开号:
US20120008746A1
申请日:
2011.09.19
申请国别(地区):
US
年份:
2012
代理人:
摘要:
A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.
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