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Photoresists containing polymer-tethered nanoparticles
专利权人:
David H. Redinger
发明人:
David H. Redinger,Robert J. DeVoe,Belma Erdogan-Haug
申请号:
US14007270
公开号:
US09104100B2
申请日:
2012.05.23
申请国别(地区):
US
年份:
2015
代理人:
摘要:
Compositions such as photoresists and microfabrication processes are provided that can produce high-fidelity microfabricated structures. The provided photoresists can have reduced swelling during the development phase and can give tight tolerances for products, such as microneedles, that can be used, for example, in the medical field. The provided compositions include a photoresist, a photoinitiator system dispersed in the photoresist, and a polymer-tethered nanoparticle dispersed in the photoresist. The photoresist can be a negative photoresist and the photoinitiator system can include a two-photoinitiator system. The polymer-tethered nanoparticle can include an acrylic polymer and, in some embodiments, can include poly(methyl methacrylate). The nanoparticles can include silica.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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