APPARATUS FOR MEASURING CRYSTALLOGRAPHIC ORIENTATION RELATIONSHIP OF ADJACENT CRYSTAL GRAINS USING GONIOMETER OF TRANSMISSION ELECTRON MICROSCOPE, AND METHOD OF EXAMINING CHARACTERISTICS OF GRAIN BOUNDARY USING THE SAME
JEONG HI WON,SEO SEONG MOON,HONG HYUN UK,YOO YOUNG SOO,KIM IN SOO,CHOI BAIG GYU,JO CHANG YONG
申请号：
JP20080318286
公开号：
JP2010027592(A)
申请日:
2008.12.15
申请国别(地区):
日本
年份:
2010
代理人:
摘要：
PROBLEM TO BE SOLVED: To provide an apparatus and method of measuring crystallographic orientation relationship of adjacent crystal grains using the goniometer of a transmission electron microscope capable of accurately observing the orientation relationship of two crystal grains and characteristics of their grain boundary in real time. SOLUTION: Values of (Tx, Ty) for axes perpendicular to X- and Y- tilt axes, respectively, with respect to crystal axes (H1, H2, H3) are measured using a goniometer to determine the included angles of crystal axes (H1, H2, H3) from three values of (Tx, Ty) measured with respect to the crystal axes (H1, H2, H3). Then included angles of (H1, H2, H3) are crystallographically calculated from their crystallographic indices. The included angles obtained from measured values (Tx, Ty) are compared to the included angles crystallographically calculated, and values (Tx, Ty) that minimize the differences are chosen as the correct values to determine the relationship between the tilt axes and the crystal axes (H1, H2, H3). Subsequently, characteristics of the crystal grain boundary are examined using the misorientation matrix between two crystals. COPYRIGHT: (C)2010,JPO&INPIT
