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ASSESSMENT SYSTEM AND METHOD FOR DETERMINING AT LEAST ONE OF MACRO-TOPOLOGY, MILLI-TOPOLOGY, MICRO-TOPOLOGY AND NANO-TOPOLOGY
专利权人:
发明人:
Heikki Nieminen,Tuomo Ylitalo,Simo Saarakkala,Edward Haeggström
申请号:
US15977832
公开号:
US20180256089A1
申请日:
2018.05.11
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An assessment method is disclosed to determine at least one of macro-topology, milli-topology, micro-topology and nano-topology of at least one interface of at least two media using topology of the interface. Topology information of the interface is processed by performing segmentation of volume information of the obtained information from background information of the obtained information. Reference surface information is generated and information on voids is obtained and analyzed to provide multivalued surface shape information. Quantitative mapping of the information on voids is performed using the multivalued surface shape information for determining at least one of macro-topology, milli-topology, micro-topology and nano-topology of the interface.
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