Method to evaluate the presence of a source of x-ray beam inhomogeneity during x-ray exposure

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专利权人:

Agfa HealthCare NV

发明人:

Marc Cresens,Herman Van Goubergen

申请号：

US14402363

公开号：

US09741102B2

申请日:

2013.06.05

申请国别(地区):

US

年份:

2017

代理人:

摘要：

A statistical analysis is performed on pixel values of at least one region of interest in an image obtained by substantially uniform irradiation of an x-ray detector and deciding upon the presence of a source of x-ray beam in-homogeneity by comparing the results of the statistical analysis with at least one predetermined acceptance criterion.

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中国工程科技知识中心

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http://www.ckcest.cn/home/