1. An imaging system (500), comprising: a focal spot (508) configured to rotate along a path around the inspection area and emit a beam of radiation that passes through the field of view of the survey area； an array (520) of detectors located opposite the radiation source and through the survey area, while the array of detectors is configured to detect radiation passing through the field of view, and issuing a signal indicating the detected radiation； and a beam forming device (524) located between the radiation source and the inspection area, the beam forming device being configured to rotate with the focal spot and relative to the focal spot in the opposite direction from the focal spot with the same angular frequency with which the focal spot rotates, and attenuation of the radiation beam, which reduces the flux density over the array of detectors for each angle of rotation of the focal spot. 2. The imaging system according to claim 1, further comprising: a filter located between the focal spot and the beam forming device, wherein the filter attenuates the beam so that the beam intensity at each pixel is approximately the same. The imaging system of claim 2, wherein the beam forming apparatus includes an X-ray attenuating material that attenuates radiation passing through a field of view that does not pass through a subject or object located in an examination area. Visualization system according to any one of paragraphs. 1-3, in which the beam forming device has an external elliptical perimeter (600) and an elliptical internal perimeter (602)1. Система (500) визуализации, содержащая:фокусное пятно (508), выполненное с возможностью поворота по траектории вокруг области обследования и испускания пучка излучения, который проходит через поле обзора области обследования；массив (520) детекторов, расположенный противоположно источнику излучения и через область обследования, при этом массив детекторов выполнен с возможностью обнаружения излучения, проходящего через поле
