UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNGHEEUNIVERSITY;OH, DONG IN;KWON, OH IN;WOO, EUNG JE;SEO, JIN KEUN
发明人:
WOO, EUNG JE,OH, DONG IN,SEO, JIN KEUN,KWON, OH IN
申请号：
EP06769312
公开号：
EP1978870A4
申请日:
2006.07.28
申请国别(地区):
EP
年份:
2015
代理人:
摘要：
A system for electrical impedance tomography and method thereof are disclosed, by which electrical characteristics within a measurement target can be precisely detected. The present invention includes the steps of injection a current to a measurement target via at least one electrode pair selected form a plurality of electrodes (250) attached to the measurement target, detecting voltage of a surface of the measurement target using a plurality of voltmeters (260) connected to the electrodes that are not selected, respectively, adjusting gains of the voltmeters according to maximum values of the detected voltages, respectively, amplifying the detected voltages using the gain-adjusted voltmeters, respectively, and imaging an internal part of the measurement target based on the amplified voltages.
