您的位置: 首页 > 农业专利 > 详情页

METHODS AND SYSTEMS FOR METAL ARTIFACT REDUCTION IN SPECTRAL CT IMAGING
专利权人:
General Electric Company
发明人:
Kriti Sen Sharma,Hewei Gao,Debashish Pal
申请号:
US14706759
公开号:
US20160324499A1
申请日:
2015.05.07
申请国别(地区):
US
年份:
2016
代理人:
摘要:
Various methods and systems for spectral computed tomography imaging are provided. In one embodiment, a method comprises acquiring a first projection dataset and a second projection dataset, detecting a location of metal in the first projection dataset, applying corrections to the first and second projection datasets based on the location of the metal, and displaying an image reconstructed from the corrected first and second projection datasets. In this way, metal artifacts may be substantially reduced in dual or multi-energy CT imaging.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充