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DISPOSITIF DE CALCUL POUR LA DÉTERMINATION DE DÉFAUTS DE VENTILATION
专利权人:
Koninklijke Philips N.V.
发明人:
申请号:
EP18194249.1
公开号:
EP3622891A1
申请日:
2018.09.13
申请国别(地区):
EP
年份:
2020
代理人:
摘要:
The present invention relates to a calculation device (10) for comparing dark-field X-ray images. The calculation device (10) is configured for receiving a first dark-field X-ray image (11) describing first dark-field X-ray signals of a patient at an expiration state and for receiving a second dark-field X-ray image (12) describing second dark-field X-ray signals of the patient at an inspiration state. The calculation device is further (10) configured for normalizing the first dark-field X-ray signals of the first dark-field X-ray image (11) with a lung thickness value describing the lung thickness at the expiration state and for normalizing the second dark-field X-ray signals of the second dark-field X-ray image (12) with a lung thickness value describing the lung thickness at the inspiration state. Further, the calculation device (10) is configured for comparing the normalized first dark-field X-ray signals with the normalized second dark-field X-ray signals, thereby determining a comparison result (13) and for determining whether at least one area of the patient's lung with a ventilation defect exists based on the comparison result (13).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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