RADIATION DETECTION ELEMENT SUBSTRATE, INSPECTION DEVICE FOR RADIATION DETECTION ELEMENT SUBSTRATE AND METHOD FOR INSPECTING RADIATION DETECTION ELEMENT SUBSTRATE
PROBLEM TO BE SOLVED: To provide a radiation detection element substrate capable of inspecting a radiation detection element substrate having a plurality of transistors in one pixel without drastically adding or changing of the inspection device for the radiation detection element substrate having one transistor in one pixel, an inspection device for the radiation detection element substrate, and a method for inspecting the radiation detection element substrate.SOLUTION: A connection wiring part 22 for inspection in which control wirings M extend to the outside than a mounting substrate and are connected to each other, is provided. The gate off voltage is applied to wiring terminals 24 at one time, connected to the connection wiring part 22 for inspection, to perform the inspection.【課題】１画素に１つのトランジスタを有する放射線検出素子基板の検査用の検査装置に対して、大きな追加変更を行うことなく、１画素に複数のトランジスタを有する放射線検出素子基板の検査を行うことが可能な放射線検出素子基板、放射線検出素子基板の検査装置、及び放射線検出素子基板の検査方法を提供することを目的とする。【解決手段】実装基板よりも外側の領域まで、制御配線Ｍを延長して、互いに結線する検査用接続配線部２２を設けている。そして、検査用接続配線部２２に接続された結線端子２４にゲートオフ電圧を一括して印加して、検査を行う。【選択図】図４
