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光干渉断層法を用いる撮像装置及び撮像方法
专利权人:
キヤノン株式会社
发明人:
黒坂 亮治,末平 信人,宇都宮 紀彦,那波 孝,山田 和朗,鈴木 圭
申请号:
JP2010061054
公开号:
JP5306269B2
申请日:
2010.03.17
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
The present invention relates to an apparatus having a simple configuration capable of correctly detecting malfunction of an OCT apparatus by detecting the states of a light source and a sensor. An image pickup apparatus includes a switching unit that switches between a first mode in which a combined light beam of a return light beam from a specimen and a reference light beam is detectable by a detecting unit and a second mode in which the reference light beam is detectable by the detecting unit. The image pickup apparatus is switchable to the first mode on the basis of an intensity of the reference light beam detected by the detecting unit in the second mode.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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