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X-ray inspection apparatus
专利权人:
Tomoharu Okuno
发明人:
Tomoharu Okuno
申请号:
US13885661
公开号:
US08950937B2
申请日:
2010.11.26
申请国别(地区):
US
年份:
2015
代理人:
摘要:
When a size of a flat panel detector, contained in an X-ray detector containing part, in a body axial direction of a subject is detected, a detected value of a potentiometer, and stored information on a maximum size of a flat panel detector, containable in the X-ray detector containing part, in the body axial direction of the subject are compared with each other. If the size of the flat panel detector contained in the X-ray detector containing part coincides with the maximum size of the flat panel detector containable in the X-ray detector containing part, a reference position information switching part switches reference position information stored in a reference position information storage part. When an operator performs a predetermined operation on an operation part by pressing a switch or performing another action, the stored reference position information is changed to a preset reference position.
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