您的位置: 首页 > 农业专利 > 详情页

APPARATUS AND METHOD MEASURING IMPEDANCE
专利权人:
Samsung Electronics Co.; Ltd.
发明人:
JongPal KIM
申请号:
US16375899
公开号:
US20190383760A1
申请日:
2019.04.05
申请国别(地区):
US
年份:
2019
代理人:
摘要:
An impedance measuring apparatus and method is disclosed. The impedance measuring apparatus includes one or more capacitors configured to receive an induced signal determined by an impedance of a measurement target, a controller configured to output a control signal to selectively turn a switch on or off based on whether a voltage value of the induced signal is included in a threshold range, and the switch configured to determine whether to set, to be a reference voltage value, a voltage value of a capacitor voltage signal output from the one or more capacitors based on the control signal.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充