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PARAMETER ESTIMATION METHOD AND X-RAY CT SYSTEM
专利权人:
HITACHI; LTD.
发明人:
Kazuma YOKOI
申请号:
US16636404
公开号:
US20200245956A1
申请日:
2018.06.07
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An X-ray CT device and a computing unit to use a projection-based method for image reconstruction are included. The computing unit sets a coordinate space having coordinate axes of the thicknesses of base materials and likelihood of said thicknesses, and then based on X-ray attenuation responses, executes: a first search to search in a direction perpendicular to a ridge direction of likelihood contours for a first estimated thickness having the highest likelihood, starting with an estimated thickness input value set in the coordinate space; a second search to search for a second estimated thickness having the highest likelihood, starting with a shifted starting point at a position shifted from the estimated thickness input value; and a third search to search on a line connecting the first estimated thickness with the second estimated thickness for the highest likelihood estimator having the highest likelihood, to obtain an estimated thickness output value.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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