A measuring device for measuring a physical property of an object which is irradiated with an electromagnetic wave pulse. The measuring device includes a waveform obtaining unit which obtains a time waveform from a signal relating to the electromagnetic wave pulse reflected from a first reflection portion and a second reflection portion of the object. The waveform obtaining unit obtains a first obtained waveform at a first collection point where a parallel region of the electromagnetic wave pulse is adjusted by a position adjusting unit so as to be in only one of the first reflection portion and the second reflection portion of the object, and obtains a second obtained waveform at a second collection point different from the first collection point. A waveform forming unit forms a measured waveform based on the first obtained waveform and the second obtained waveform.