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脳機能計測装置及び計測方法
专利权人:
国立大学法人;奈良先端科学技術大学院大学
发明人:
徳田 崇,太田 淳,笹川 清隆,野田 俊彦
申请号:
JP2012229419
公开号:
JP6089568B2
申请日:
2012.10.17
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a brain function measurement apparatus capable of eliminating the need for large-scaled surgical operation during extended measurement, reducing the burden on a subject and a risk of developing an infection disease, and ensuring long-term stabilized measurement even when a failure occurs in the apparatus.SOLUTION: A plurality of electrode bodies 1 are attached such that the electrode bodies 1 penetrate the skull 102 of a subject 100, tips 12 are brought into contact with brain surfaces, and base parts 13 are exposed to the outside of the skull 102. A supracranial unit 2A, which is integrated with an electric circuit part 22 to communicate signals by radio with an extracorporeal unit 3 disposed outside the subject 100, is provided with contact parts 21 each coming into contact with the base part 13 of each electrode body 1 on the entire under surface thereof, and is fixed to the skull 102 in an easily detachable manner. In the event that leak of a hazardous liquid is caused by a failure of a supracranial unit 2A, the liquid will not reach the brain. When a supracranial unit 2A is exchanged, only a part of the scalp 101 needs to be incised by a simple operation no complicated operation is needed.
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