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Semiconductor X-ray Detector
专利权人:
LTD.;SHENZHEN XPECTVISION TECHNOLOGY CO.
发明人:
Peiyan CAO,Yurun LIU
申请号:
US15122456
公开号:
US20180017686A1
申请日:
2015.04.07
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Disclosed herein is an apparatus suitable for detecting x-ray, comprising: an X-ray absorption layer comprising an electrode; an electronics layer, the electronics layer comprising: a substrate having a first surface and a second surface, an electronics system in or on the substrate, an electric contact on the first surface, a via, and a redistribution layer (RDL) on the second surface; wherein the RDL comprises a transmission line; wherein the via extends from the first surface to the second surface; wherein the electrode is electrically connected to the electric contact; wherein the electronics system is electrically connected to the electric contact and the transmission line through the via.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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