表面性状測定装置
- 专利权人:
- 发明人:
- 申请号：
- JP20110081427
- 公开号：
- JP5681021(B2)
- 申请日:
- 2011.04.01
- 申请国别(地区):
- 日本
- 年份:
- 2015
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To quantitatively and comprehensively evaluate the surface property of a surface close to a mirror surface based on an intex close to a unique sensitivity of each product or business field.
SOLUTION: A mirror surface instrument 1 is configured to project, by a computer control, a check pattern displayed on a display 11, to a measuring object surface 21, capture a reflection image by an image pickup device 12, acquire the image data and cause the computer 3 to process the data. The surface property measuring apparatus, using the mirror surface instrument 1, imports in the computer 3, computer software 5 including calculation logic of a plurality of measurement items such as mirror specularity, mirror specularity variation, glossiness, sharpness, waviness or shape error, contrast and white turbidity, automatically and sequentially measure the plurality of measurement items, and evaluate the surface property with the plurality of measurement items including the mirror specularity
- 来源网站：
- 中国工程科技知识中心
