Specific absorption rate measurement and energy-delivery device characterization using thermal phantom and image analysis

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专利权人:

Jonathan A. Coe;Ronald J. Podhajsky

发明人:

Ronald J. Podhajsky,Jonathan A. Coe

申请号：

US12792970

公开号：

US09377367B2

申请日:

2010.06.03

申请国别(地区):

US

年份:

2016

代理人:

摘要：

A method of predicting a radiation pattern emitted by an energy applicator includes the steps of providing thermal profile data for an energy applicator, determining a specific absorption rate around the energy applicator as a function of the thermal profile data, and generating a simulated radiation pattern for the energy applicator as a function of the determined specific absorption rate.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/