An apparatus (1) for detecting a 3D structure of an object comprises a firstlaser emitter (2a), which generates laser radiation having a first wavelength,asecond laser emitter (2b), which generates laser radiation having a secondwavelength, wherein the first wavelength differs from the second wavelength,optical devices (4, 9, 10, 13, 14), of which at least one is a beam splitter(4),which splits the laser radiation of the laser emitters (2, 2a, 2b) in eachcaseinto a reference radiation (5) and an illuminating radiation (6), wherein theilluminatingradiation (6) impinges upon the object (15) to be measured, is reflectedby the object (15) as object radiation (21) and interferes with the referenceradiation (5), and a detector (12), which receives the interference patternsformed therefrom.The laser emitters (2, 2a, 2b) are located in such a manner that theilluminatingradiation (6) of the first laser emitter (2a) and the illuminating radiation(6)of the second laser emitter (2b) impinge upon the object (15) at differentanglesof incidence.The apparatus (1) further comprises a measuring device (27), whichmeasures the two wavelengths of the laser radiation of the laser emitters (2,2a, 2b) and influences the recording of the interference patterns.
