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X-ray imaging system and method
专利权人:
Patrick A. Helm;Shuanghe Shi
发明人:
Patrick A. Helm,Shuanghe Shi
申请号:
US13078596
公开号:
US09411057B2
申请日:
2011.04.01
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An X-ray imaging system can include an X-ray source that projects a beam of X-ray radiation and an X-ray detector positioned to receive the beam of X-ray radiation at a location. The X-ray detector can include: (i) a monolithic substrate having a first side and a second side opposite the first side, (ii) a scintillation layer arranged upon the first side and including a first region and a second region, the first region having a first X-ray sensitivity and the second region having a second X-ray sensitivity different than the first X-ray sensitivity, and (iii) a photosensor array arranged upon the second side. The X-ray source and X-ray detector can be configured to adjust the location at which the X-ray detector receives the beam of X-ray radiation such that the location is primarily within the first region or the second region.
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中国工程科技知识中心
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