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LENS INFORMATION MANAGEMENT SYSTEM FOR SURFACE CONDITION MEASUREMENT AND ANALYSIS AND INFORMATION MANAGEMENT METHOD FOR SURFACE CONDITION MEASUREMENT AND ANALYSIS
专利权人:
Ltd.;Hitachi Maxell
发明人:
Hiroe NAKAJIMA,Masashi YOSHIMURA
申请号:
US15031765
公开号:
US20160262624A1
申请日:
2014.10.23
申请国别(地区):
US
年份:
2016
代理人:
摘要:
Provided are a system and method for surface condition measurement and analysis to effectively utilize image data photographed when a surface as an object is photographed regularly and continuously. When a surface as an object is sequentially photographed as time passes and the photographed image data is sequentially stored, the sequentially stored images are compared and the presence or absence of image regions among the images that nearly coincide with each other is determined. When there are images with image regions that nearly coincide with each other, a coordinate system having one image as a reference is set, and a position of the other image in the coordinate system is determined. When an image with an undetermined position overlaps with an image with a determined position, including images photographed subsequent thereto, the position of the image is determined.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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