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PROCÉDÉ ET DISPOSITIF POUR L'IMAGERIE TRIDIMENSIONNELLE PAR LA MICROSCOPIE INTERFÉRENTIELLE PLEIN CHAMP
专利权人:
LLtech Management
发明人:
申请号:
EP11738662.3
公开号:
EP2591389B1
申请日:
2011.07.08
申请国别(地区):
EP
年份:
2018
代理人:
摘要:
A device for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample includes an imaging interferometer of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample. The invention also relates to a processing unit that processes the interferometric images, a unit for axially displacing the interferometer relative to the sample for the acquisition of tomographic images for slices at different depths of the sample, and a unit for varying the magnification of the imaging interferometer for the acquisition of interferometric images of a slice for different magnification values.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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