Bruce D. Gunderson;Amisha S. Patel;Robert W. Stadler
发明人:
Robert W. Stadler,Bruce D. Gunderson,Amisha S. Patel
申请号：
US12180304
公开号：
US08644931B2
申请日:
2008.07.25
申请国别(地区):
US
年份:
2014
代理人:
摘要：
In general, the disclosure relates to techniques for calculating mean impedance values and impedance variability values to detect a possible condition with a lead or device-lead pathway or connection. In one example, a device may be configured to determine an impedance value for an electrical path based on a plurality of measured impedance values for the electrical path, wherein the electrical path comprises a plurality of electrodes, and to determine an impedance variability value based on at least one of the plurality of measured impedance values. The device may be further configured to determine a threshold value based on the determined impedance value and the impedance variability value, compare a newly measured impedance value for the electrical path to the threshold value, and indicate a possible condition of the electrical path based on the comparison.
