PROBLEM TO BE SOLVED: To provide a configuration that has high resistance with respect to a disturbance, and can obtain a correct measurement result in an endoscope system having a three-dimensional measurement technology.SOLUTION: An endoscope system comprises: a pattern projection unit that irradiates a sample with measurement light of a predetermined wavelength band of a structured pattern for three-dimensionally measuring the sample and a three-dimensional measurement unit that implements a three-dimensional measurement with respect to the sample in accordance with a specified measuring point on the basis of a measurement image of the sample obtained by irradiation of the measurement light. The pattern projection unit is configured to: shift a phase of a plurality of measurement light with which the sample is irradiated to a mutually different phase arrange each of the plurality of measurement light having the phase shifted in a tip end part of the endoscope system so as to juxtapose in proximity to a predetermined direction in accordance with a shape of the structured pattern and sequentially emit the measurement light from an emerging end corresponding to respective measurement light, and the three-dimensional measurement unit is configured to implement the three-dimensional measurement on the basis of respective measurement images obtained by the irradiation of respective measurement light.SELECTED DRAWING: Figure 1COPYRIGHT: (C)2017,JPO&INPIT【課題】3次元の計測技術を搭載した内視鏡システムにおいて、外乱に対して高い耐性を有し、正確な計測結果を得ることができる構成を提供する。【解決手段】被検物を3次元で計測するために構造化したパターンの予め定めた波長帯域の計測光を被検物に照射するパターン投影部と、計測光を照射して得た被検物の計測画像に基づいて、指定された測定点に応じた被検物に対する3次元の計測を行う3次元計測部と、を備えた内視鏡システムであって、パターン投影部は、被検物に照射する複数の計測光の位相を互いに異なる位相にシフトし、位相をシフトした複数の計測光のそれぞれを、内視鏡システムの先端部に構造化したパターンの形状に応じて予め定めた方向に近接して並ぶように配置し、それぞれの計測光に対応する出射端から順次出射し、3次元計測部は、それぞれの計測光の照射によって得たそれぞれの計測画像に基づいて、3次元の計測を行う。【選択図】図1
