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CONCENTRATION QUANTIFYING DEVICE, OPTICAL ABSORPTION COEFFICIENT CALCULATION METHOD, EQUIVALENT SCATTERING COEFFICIENT CALCULATION METHOD, CONCENTRATION QUANTIFYING METHOD, PROGRAM FOR CALCULATING OPTICAL ABSORPTION COEFFICIENT, AND PROGRAM FOR CALCULATING CONCENTRATION
专利权人:
SEIKO EPSON CORP;国立大学法人北海道大学;セイコーエプソン株式会社;HOKKAIDO UNIV
发明人:
NISHIDA KAZUHIRO,西田 和弘,SHIMIZU KOICHI,清水 孝一,KATO YUJI,加藤 祐次,NAMIDA KEN,浪田 健
申请号:
JP2011211687
公开号:
JP2013070822A
申请日:
2011.09.27
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a concentration quantifying device reducing influence of noise by layers except an objective layer.SOLUTION: This concentration quantifying device includes: an irradiator 101; a first light receiving unit 102; a second light receiving unit 103; a first optical intensity acquiring unit 104; a second optical intensity acquiring unit 105; a first equivalent scattering coefficient calculator 106; an optical path length distribution storage unit 108; a time resolution waveform storage unit 109; an optical path length acquiring unit 110; an optical intensity model acquiring unit 111; an optical absorption coefficient calculator 112 calculating an optical absorption coefficient of an optional layer based on optical intensity acquired by the first optical intensity acquiring unit 104, the second optical intensity acquiring unit 105, or a third optical intensity acquiring unit, an optical path length of each layer of a plurality of layers of light scattering media acquired by the optical path length acquiring unit 110, and an optical intensity model acquired by the optical intensity model acquiring unit 111; and a concentration calculator 114 calculating the concentration of an objective component in the optional layer based on the optical absorption coefficient calculated by the optical absorption coefficient calculator 112.【課題】目的の層以外の層によるノイズの影響を軽減する濃度定量装置を提供する。【解決手段】照射手段101と、第1受光手段102と、第2受光手段103と、第1光強度取得手段104と、第2光強度取得手段105と、第1等価散乱係数算出手段106と、光路長分布記憶手段108と、時間分解波形記憶手段109と、光路長取得手段110と、光強度モデル取得手段111と、第1光強度取得手段104または第2光強度取得手段105、若しくは第3光強度取得手段が取得した光強度と、光路長取得手段110が取得した複数の光散乱媒質の層の各々の層の光路長と、光強度モデル取得手段111が取得した光強度モデルと、に基づいて、任意の層の光吸収係数を算出する光吸収係数算出手段112と、光吸収係数算出手段112が算出した光吸収係数に基づいて、任意の層における目的成分の濃度を算出する濃度算出手段114と、を含む。【選択図】図1
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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