A method is for determining a spatial distribution of a material property value in an examination region of an examination object. According to an embodiment, the method includes capturing measurement projection data； reconstructing image data based upon the captured measurement projection data； estimating a distribution of two basic materials using a threshold value by classifying image points； determining a distribution of the two basic materials based upon the estimated distribution and a general dependency rule； and determining a spatial distribution of the material property value, independent of the measurement energy, based upon the determined distribution and based upon a previously known theoretical relationship between the distribution of the material property value and a distribution of the two basic materials. In addition, a material property distribution determining device is described in one embodiment, and a computer tomography system is also described in another embodiment.
