NOVEL SPECTRAL CT SYSTEMS AND METHODS

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专利权人:

RENSSELAER POLYTECHNIC INSTITUTE

发明人:

Ge Wang,Yan Xi,Wenxiang Cong,Zaifeng Shi

申请号：

US15538376

公开号：

US20170360385A1

申请日:

2015.12.22

申请国别(地区):

US

年份:

2017

代理人:

摘要：

Novel and advantageous methods and systems for performing spectral computed tomography are provided. An edge-on detector, such as a silicon strip detector, can be used to receive X-rays after passing through a sample to be imaged. An energy resolving process can be performed on the collected X-ray radiation. The CT scanner can have third-generation or fourth-generation geometry.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/