John P. Handy;David C. Walazek;Richard L. Schueller;Terry Lee McElroy;William J. Baukus;Jeffrey R. Schubert
发明人:
Jeffrey R. Schubert,John P. Handy,Richard L. Schueller,Terry Lee McElroy,David C. Walazek,William J. Baukus
申请号：
US13446790
公开号：
US08923481B2
申请日:
2012.04.13
申请国别(地区):
US
年份:
2014
代理人:
摘要：
Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.
