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Analyzing device, sensor testing device, testing method and computer-readable storage medium
专利权人:
Shinjiro Sekimoto
发明人:
Shinjiro Sekimoto
申请号:
US13365054
公开号:
US09297777B2
申请日:
2012.02.02
申请国别(地区):
US
年份:
2016
代理人:
摘要:
There is provided a sensor testing method including: applying at least one of a first voltage that obtains a response caused by a substance and a second voltage that either obtains no response or substantially no response caused by the substance across a first electrode and a second electrode of a sensor; measuring current flowing between the first electrode and the second electrode; and determining whether or not there is a defect present in the sensor based on a quantity related to an amount of change per specific period of time of a current measured when the first voltage and/or the second voltage have been applied.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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